CAR Tool: Customizable Analysis Report

ISO 26262-Compliant Safety Analysis Tool Allowing for a High Degree of Customization

MCUs and other semiconductors are typically sold as Safety Elements out of Context (SEooC): developed on a series of assumptions regarding the final application. These assumptions are also reflected in the device’s supporting documentation and ISO 26262-compliance claims.

Renesas’ assumptions for SEooCs are as close as possible to the actual requirements of the final application; nevertheless, they may not take into account all possible customer tailoring and variables.

The CAR (Customizable Analysis Report) is Renesas’ answer to a very common
market problem: modify a SEooC safety analysis report to fully match with the final application constraints.

The CAR tool enables the user to change any analysis parameters (timing constraints, failure modes, FIT source, fault impact, fault coverage) at any time.

The CAR tool provides all results required by ISO 26262: Single-Point Fault Metric, Latent Fault Metric, PMHF estimation, and EEC (Evaluation of Each Cause) acceptance support. It provides results not only for the entire device level, but also at the element level, accurately splitting its FIT in the appropriate fault class (SPF, RF, LF, etc.).

The CAR tool supports multiple safety goals for the device and multiple use cases for its elements.

The CAR tool also boasts an extensive set of notifications that help the user avoid mistakes and offers a complete set of features to help the user complete the activity quickly.

This innovative tool is the source of three different patents.


  • Multiple safety goals and use cases
  • Results in detailed ISO 26262 fault classification
  • ISO 26262 random HW faults metrics calculation
  • ISO 26262 PMFH and EEC acceptance estimation
  • Modify fault impact and fault coverage estimation
  • Add/remove safety mechanisms
  • Revision control support
  • Automatic change history generation
  • Permanent and transient faults analyses in a single place
  • Change FIT source and fault characterization
  • Error/warning notification set to support the user
  • Charting feature to plot results
  • Support for DFA (Dependent Failure Analysis)
  • Highly automated GUI
  • Embed and refer supporting documents